Dispersive X-Ray Synchrotron Studies of Pt-C Multilayers

Synchrotron X-Ray Studies of Surface Disordering Semiconductor Surface Studies

High resolution X-ray scattering studies of substrates and multilayers

2014 High resolution X-ray scattering measurements on multilayer substrates and surfaces are reviewed. It is shown that the usual substrates of float glass and Si-wafers are dominated by large scale figure error, whereas samples of super polished SiC substrates are comparable in flatness and roughness to state-ofthe-art test flats from current X-ray telescope programs. Likewise high resolution ...

Synchrotron X–ray Studies of Austenite and Bainitic Ferrite

High resolution synchrotron X–ray diffraction has been used to conduct in situ studies of the temporal evolution of phases during the isothermal growth of bainite. Two populations of austenitic material were identified: one corresponding to the initial austenite, the other to the carbon–enriched austenite associated with the bainitic ferrite. The observed lattice parameters and the asymmetry of...

Synchrotron x-ray diffraction studies of actin structure during polymerization.

Synchrotron x-ray diffraction was used to identify the oligomers that formed during the earliest stages of actin polymerization. Solution diffraction patterns from G-actin (monomer) and from F-actin (polymer) contain information about the size and shape of actin monomers and the length, width, and subunit organization of filaments. Comparison of patterns collected during polymerization reveals ...

Chapter 2 . Synchrotron X - ray Studies of Surface Disordering

In this research program, we use modern x-ray scattering techniques to study structures and phase transitions in thin films and on surfaces. We have two principal experimental facilities, one at MIT and the other at the National Synchrotron Light Source at Brookhaven National Laboratory. At MIT, we have four high-resolution computer-controlled x-ray spectrometers. The angular resolution can be ...